Keyword Analysis & Research: depth profile analysis

sciencedirect.com

https://www.sciencedirect.com/topics/chemistry/depth-profiling

Depth Profiling Radioisotope mass spectrometry. Depth profiling by GDMS is in use for the study of the mechanism of corrosion of... Characterization of Thin Films and Coatings. Depth profiling is now routinely possible with modern instruments equipped... Oxidation characteristics of Ti3AlC2, Ti3SiC2 ...

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nanolabtechnologies.com

https://www.nanolabtechnologies.com/Depth-Profiling/

Depth Profiling is a process where the element or chemical content of a sample is measured as a function of depth. Many analysis techniques that perform depth profiling use a beam of ions such as Ar+, Ga+, Cs+, or O2+. Other depth profiling techniques use pulses of laser light, plasma beams, glow discharge or confocal manipulation of the sample in the Z axis.

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leica-microsystems.com

https://www.leica-microsystems.com/science-lab/depth-profiling-and-layer-analysis-for-inspection-of-materials-with-a-2-in-1-solution-combining-optical-microscopy-and-laser-spectroscopy/

Jul 15, 2020 · Depth Profiling and Layer Analysis for Inspection of Materials with a 2-In-1 Solution Combining Optical Microscopy and Laser Spectroscopy Introduction. Products and applications in the industries of metal alloy, automotive, aerospace, transportation, and... Depth Profile Analysis of Materials. The ... Author: James DeRose, Kay Scheffler, Konstantin Kartaschew Publish Year: 2020

Author: James DeRose, Kay Scheffler, Konstantin Kartaschew

Publish Year: 2020

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sciencedirect.com

https://www.sciencedirect.com/topics/engineering/depth-profile

A depth profile of target atoms in a sample is estimated from the detection energy and yield of recoil particles elastically scattered by the probing neutrons. The detection energy E d of the recoil particle is expressed as: E d = E r − d E ( x ), where E r and d E ( x ) are the recoil energy and the energy loss of the recoil particle before reaching the sample surface.

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chempedia.info

https://chempedia.info/info/depth_profile_analysis/

Depth profile analysis We know from the Boltzmann distribution that most atoms are in the ground state even at the temperatures found in GFs. Therefore, most analytical AFS uses ground-state resonance fluorescence transitions because these have the greatest transition probability and thus result in the highest

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springer.com

https://link.springer.com/article/10.1007/s00216-010-3539-5

Feb 24, 2010 · Up to10%cash back · The ability to carry out the in-depth profile analysis of a given material, i.e., to determine the changes in the composition of major and trace components from the surface down to the bulk homogeneous solid, provides information about the composition and thickness of the layers, the distribution of doping constituents, possible diffusion …

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nih.gov

https://pubmed.ncbi.nlm.nih.gov/32000875/

Depth Profile Analysis of Thin Oxide Layers on Polycrystalline Fe-Cr Microsc Microanal. 2020 Feb;26(1) :112-119. ... Correlative microscopy was applied, which allows for element-specific depth profiles on selected grains with a particular crystal orientation. A strong correlation between the grain orientation and the thickness of the oxide ...

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